Abstract
X-ray diffraction and capacitance measurements have been employed to study the structural and dielectric behavior of the ferroelectric-paraelectric phase transition under the influence of a large external electric field. The samples under study are ultrathin (15–100nm) Langmuir–Blodgett films of a copolymer of vinylidene fluoride (70%) with trifluoroethylene (30%) deposited on aluminum-coated silicon. In situ θ-2θ x-ray diffraction was used to measure the change in interlayer spacing perpendicular to the film surface, corresponding to the (110) direction and indicating that the polymer chains along (001) lie predominantly in the plane, while capacitance measurements were used to monitor the behavior of the dielectric constant of the film. Application of a large electric field, up to 265MV∕m, raises the phase transition temperature and can convert the nonpolar trans-gauche paraelectric phase to the polar all-trans ferroelectric phase in a reversible manner.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
