Abstract
Ag/[BN/CoPt]5/Ag and [BN/Ag/CoPt]5/Ag thin films were deposited on glass substrates by magnetron sputtering and then annealed in vacuum at 600°C for 30 min. The structures and magnetic properties of CoPt/BN multilayer films were investigated as a function of Ag layer thickness. It was found that the face-centered tetragonal (fct) (001) texture of CoPt was improved greatly by introducing the Ag toplayer or sublayer together with an Ag underlayer. Good (001)-oriented growth, low intergrain interactions as well as high perpendicular anisotropy can be obtained in the Ag(3 nm)/[BN(2.5 nm)/CoPt(3 nm)]5/Ag(7 nm) and [BN(2.5 nm)/Ag(2 nm)/CoPt(3 nm)]5/Ag(10 nm) films, which become potential candidates for ultrahigh density magnetic recording media.
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