Abstract

It is well known that the Cr underlayer plays significant role in the magnetic properties of Co alloy film. In this study, the effects of the underlayer materials such as Cr, Mo, W, W/Cr, and Al and their thickness on the magnetic properties of SmCo films were studied. In the x-ray diffraction diagrams of the SmCo/Cr film and the SmCo/Mo film, only (110) line of body-centered-cubic crystal structure was observed, while diffraction lines from SmCo phase could not be observed. The oval shaped grains were observed on the surface of Cr underlayer and the Mo underlayer when the thickness was thicker than 100 nm. The coercivity of the SmCo/Cr film and the SmCo/Mo film with thickness over 100 nm was higher than 3 kOe and the squareness ratio and the coercivity squareness ratio was above 0.8 and 0.9, respectively. These results indicate the Cr underlayer and the Mo underlayer are suitable for SmCo layers in order to increase the coercivity and the SmCo/Cr film and the SmCo/Mo film are good candidates for high density recording media.

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