Abstract
Zn0.5Cd0.5S polycrystalline thin films of different thickness were deposited on cleaned glass substrates by spray pyrolysis technique. X-ray diffraction was used to characterize the thin films. X-ray diffraction study showed that, all the films have the hexagonal, wurtzite structure. Grain sizes calculated from Scherer relation are in the range of 47.02-48.21 nm and the grain size of the thin films are observed to increase with the increase in the thickness of the sample. The optical properties of the polycrystalline thin films were investigated by the UV- spectroscopy. The band gap of the thin films is found to be direct allowed transition and decreases with the increase of thickness of films in the range of 2.85- 2.7 eV. Extinction coefficient k showed oscillatory behavior in lower band edge region. The Zn0.5Cd0.5S polycrystalline thin films are suitable for solar cell application.
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