Abstract
Measurements have been made at 35 GHz of the increase of surface resistance of plane copper surfaces caused by surface roughness. The side walls of an H-guide cavity were ground one-directionally with abrasive papers of various grades. Surface roughness was determined mechanically, optically, and by microphotography. Q factors of the cavity were measured and evaluated and compared for various degrees of surface roughness
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More From: Proceedings of the Institution of Electrical Engineers
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