Abstract
Thin films of AgSbSe2 were prepared by direct thermal evaporation of the bulk compound. The films were deposited onto various substrates, namely cleaved surfaces of NaCl, KCl, KBr, KI and NaNO3, and amorphous carbon films backed by NaCl surfaces, maintained at different temperatures. The growth characteristics of the deposits were studied using transmission electron microscopy and the selected area electron diffraction technique. It was observed that the low temperature deposits were amorphous whilst those deposited at moderate temperatures were polycrystalline or epitaxial depending on the substrate material and temperature. Neither any thermal dissociation of the compound nor the presence of any extra phases was observed.
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