Abstract
Thin film of poly(3-allyl-5-[(4-nitrophenyl)diazenyl]-2-thioxothiazolidine-4-one) (PNPDT) was prepared by thermal deposition technique. Both of the infrared spectra and the atomic force microscopy (AFM) confirmed the polymeric nature of PNPDT thin films. The layered crystalline structure of the thermally deposited PNPDT thin films in as deposited and γ-irradiated conditions was confirmed by X-ray diffraction (XRD) analysis. The effect of γ-irradiation on the structural and optical properties of 3-allyl-5-[(4-nitro phenyl)diazenyl]-2-thioxothiazolidine-4-one (NPDT) powder and PNPDT thin films was investigated. The polycrystalline NPDT was completely transformed to amorphous phase after γ-irradiation with 15kGy. The optical constants such as refractive index, n, dielectric constant, ε′, lattice dielectric constant, εL, effective mass ratio, N/m⁎, the dispersion energy, Ed, the single oscillator energy, Eo, and the dielectric constant at infinity, ε∞, were calculated and the effect of γ-irradiation on them was investigated. The optical energy gap, Eg, was calculated for the as deposited PNPDT thin film and found to be 2.26eV and decreased to 1.83eV after γ-irradiation.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
