Effect of precursor dilution solvents on the growth of V2O5 thin films using spray pyrolysis

Abstract

Using the ultrasonically nebulized spray pyrolysis of the aqueous combustion mixture (UNSPACM) technique, the effect of precursor dilution solvents on the growth of V2O5 thin films is reported. V2O5 thin films are grown by spraying an aqueous combustion mixture (ACM) onto glass substrates at 400°C. Methanol and ethanol are used to dilute the ACM. FESEM, XRD, and FT-Raman spectroscopic analysis are used to examine the surface microstructure, crystallographic information, and functional groups of the grown thin films respectively. The results show that thin films grown by diluting ACM with methanol produce the best results.