Abstract
The effects of the addition of Ni2+ on the growth and various properties of ammonium dihydrogen phosphate single crystals grown from aqueous solution by the slow evaporation method have been studied. The grown crystals were subjected to HRXRD, UV–Vis, TG/DTA and dielectric studies. The structural perfection of the grown crystal has been analyzed by high resolution X-ray diffraction rocking curve measurements. UV–Vis studies show that the grown crystal has good transparency in the entire visible region which is an essential requirement for a nonlinear crystal. Higher decomposition temperature was observed from TG/DTA. Dielectric constant and dielectric loss were measured for the grown crystal for different frequencies and temperatures.
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