Abstract

Developed a silicon-based photodetector with high sensitivity integrated in the short range. The influence of gamma radiation on the mechanism of current flow in the structure type Schottky barrier, and the p-n junctions. It is shown that the double-barrier structure can improve the photoelectric parameters of conventional detectors.

Highlights

  • Silicon photodetectors, still the most common type of photoconverters

  • One of the main ways of increasing the speed and increase the spectral sensitivity of modern detectors with one transition is the creation of multi-barrier structures

  • First obtained and investigated characteristics of double-barrier structures created on the same plane have shown advantages over conventional structures

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Summary

Introduction

One of the main ways of increasing the speed and increase the spectral sensitivity of modern detectors with one transition is the creation of multi-barrier structures. Reliability of the resulting structures at elevated conditions of radiation, as detectors of ionizing radiation is an important task is the subject of our research [1,2]. Examples are Graded band gap semiconductors structure; dragging fields, etc., based on the reduction of the surface recombination velocity. In our case, such a possibility, but you can create a planar version of the field due to the p-n junction is included in the opposite direction (Figure 1)

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