Abstract
An oxide p—n heterojunction composed of Pr0.6Ca0.4MnO3 film, with a charge order (CO) transition, and 1wt% Nb-doped SrTiO3 substrate is fabricated, and the transport properties of the interface are experimentally studied. The rectifying behavior of the junction, well described by the Newman equation, is observed, indicating that tunneling is the dominant process by which the carriers pass through the interface. Above and below the CO transition temperature, satisfactory linear dependencies of junction resistance on temperature are observed, but the slopes of the two resistance-temperature relations are different. The CO process is believed to be relevant to this difference.
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