Abstract
Rectangular Permalloy nanostructures with a range of edge roughnesses were fabricated using electron beam lithography by controlling the exposure conditions of individual structures. The widths of the structures ranged from 200 nm to 611.5 nm. Each individual structure was characterized magnetically, using magneto-optical Kerr effect (MOKE) magnetometry, and structurally, using scanning electron microscopy (SEM). Increasing edge roughness enhanced the coercivity of structures with similar widths, except for the 200 nm wide structures, which showed no enhancement. The coercivity enhancement was independent of surface roughness. Large edge roughness more than doubled the coercivity of the widest structures. The experimentally determined structural edge profiles were used to model the effect of edge roughness on magnetization switching. Micromagnetic simulations showed that edge roughness distorted the spin-structure of rectangular nanomagnets prior to switching and that, compared to smooth-sided rectangles, edge roughness could lead to an increase in the switching field. However, the magnitude of the simulated increase was not as high as observed experimentally.
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