Abstract
The goal of this work is to analyze the performance of PN junction-based Built-in Current Sensors (BICS) for IDDQ testing. Two types of BIC Sensors are analyzed: one based on a simple PN junction as the sensing element (DBICS), and the other based on a lateral BJT (PBICS). The sensitivity, speed and performance of the BICS are studied by showing their dependence on circuit parameters. Design constraints of such sensors in order to achieve performance criteria on CUT and BICS are analyzed. The dynamic analysis of the BICS is compared with experimental results when the PN junction BICS are used on a CMOS circuit.
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