Abstract
Bronshtein et al. and Malat et al. have determined the escape depth of the true secondary electrons in gold and aluminium films by two different methods. The difference between the two methods results essentially from the fat that Bronshtein uses thin evaporated films on a substrate whereas Malat uses thin self-supporting films. Furthermore, their methods for measuring thickness are different. The disagreement in the results obtained by these authors has led us to repeat the measurements for thin evaporated films on a substrate, but using a film thickness monitor of the oscillating quartz-crystal type for thickness determinations. The values of the escape depth obtained for thin films of gold and aluminium are in good agreement with Bronshtein's values.
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