Abstract
Local measurements of droplet fluxes, in the core of horizontal annular flow, are employed in order to calculate the liquid concentration distribution as well as the circumferential variation of deposition rate. A relatively simple model is proposed for predicting the above quantities. Terms representing fluxes due to turbulent diffusion and gravitational settling are used in the model. An additional parameter a is introduced and is considered to represent a combination of fluxes; i.e. the net upward flux of droplets responding to turbulence and the flux of droplets that gain high inertia upon atomization. An interpretation is given of average deposition (or atomization) rates obtained from the data, by using detailed information on film thickness properties and by recognizing that only films with a local thickness greater than a critical value can contribute to atomization. The development of a physically realistic correlation for the mean deposition rate is explored.
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