Abstract
We demonstrate the abilities of various SEM techniques for domain imaging in PMN-PT crystals with different compositions. It is shown that the imaging of the chemically etched relief is limited by its destructivity and potential contrast – by low resolution and contrast instability. The optimal parameters of the imaging by backscattered electron channelling allow obtaining the high-resolution domain imaging in PMN-PT crystals. The domain structure change as a result of the phase transition are imaged. The correlation between the images of the surface domain structure obtained by scanning electron microscopy and piezoresponse force microscopy is demonstrated.
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