Abstract
The R− T transitions, critical fields and currents have been studied for films of aluminium deposited in ultrahigh vacua on liquid-helium cooled substrates in such a way as to eliminate edge effects. The critical fields of films thicker than 500 Å show the Ginzburg-Landau temperature dependence with coherence lengths between 200 and 300 Å, and film thicknesses derived from H 2 ‖ H ⊥ agree with the measured values. The R− T transitions of the thicker films do not fit the Aslamazov and Larkin prediction and changes on annealing the films for short periods indicate that they are inhomogeneous with a range of T c dependent on crystallite size and inter-crystallite coupling. Ultra-thin films have been found to exhibit superconducting behavior at temperatures close to T c for thicker films but their resistances do not decrease to zero at low temperatures and show evidence for thermally activated phase slippage as a contribution to the transition width.
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