Abstract
Phase transformation in Pd 3In thin films has been investigated using transmission electron microscopy (TEM), X-ray diffraction (XRD), and differential scanning calorimetry (DSC). Pd 3In films were sputtered onto room temperature substrates and characterized by TEM and XRD as disordered face centered cubic (fcc) structure. Ordered tetragonal structure was observed in the samples annealed up to 550 °C. DSC measurements gave a heat of transformation of 3.25 kJ/mol.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.