Abstract
In this paper, the numerical Laplace inversion technique and maximum entropy method are utilized to extract continuous positron lifetime distribution in semiconductors. The result is used to discriminate the native vacancy-type defects in as-grown GaAs and InP with different conduction type. Direct evidence of shallow positron traps were also observed in ion-implanted p-InP. It is demonstrated that the lifetime distribution can give us more detailed information on the native defects.
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