Abstract
Domain wall motion and lattice strain dynamics of ferroelectrics at resonance were simultaneously measured by combining high-power burst excitation and in situ high-energy x-ray diffraction. The increased loss at high vibration velocity was directly related to the increased domain wall motion, driven by dynamic mechanical stress. A general relationship between the microstructural strain contributions and macroscopic electromechanical behavior was established, allowing the prediction of high-power stability of ferroelectric materials. The results indicate that the materials' stability during high-power drive is predominantly related to the basic chemical composition, while the piezoelectric hardening mechanisms mainly influence the small-signal behavior.
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