Abstract
This study aims to investigate the electronic structure of negatively charged C60 by applying operando photoelectron yield spectroscopy (PYS) to a C60-based field-effect transistor (FET). After a gate voltage was applied and removed to inject electrons, an onset structure emerged in the PYS spectrum. The onset value of 3.6 eV was comparable to the electron affinity (4.0 eV) obtained using inverse photoemission spectroscopy, suggesting that the observed photoemission originated from the injected anions. These results clearly demonstrate that operando PYS can be a powerful tool for investigating carriers in n-type FETs.
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