Abstract

In this paper, the susceptibility to Electromagnetic Interference (EMI) of an analog signal acquisition front-end (AFE) due to EMI distortion in opamp-based pre-conditioning amplifiers is addressed. More specifically, the possibility to correct EMI-induced errors in the digital domain by post-processing the acquired digital waveforms is discussed and experimentally demonstrated for the first time with reference to an AFE based on EMI-sensitive, off-the-shelf operational amplifiers mounted on a specific EMI test PCB. Extensive experimental characterization in the presence of continuous wave and amplitude modulated EMI reveals the superior immunity to EMI of the proposed AFE and the robustness of the approach.

Highlights

  • In order to validate the proposed acquisition front-end (AFE) with digital-based Electromagnetic Interference (EMI) induced error cancellation and to discuss its effectiveness and versatility under different application scenarios, the EMI test printed circuit board (PCB) has been initially calibrated as discussed in Section 2.4 and illustrated in Figure 6a to get the optimal EMI suppression coefficient, which was found to be α∗ = 0.445 for the opamps considered in this test

  • The waveforms retrieved by the proposed procedure (y in Equation (10)) are compared with those obtained by direct digitizing of the OPA2277 and of the MCP6V02 opamps output voltages corrupted by EMI (y1 and y2 in Equations (8) and (9), and by the output y1 and y2 obtained under the same conditions without EMI injection

  • EMI-induced errors related to EMI rectification in opamp-based conditioning amplifiers can be compensated in the digital domain by a very simple weighted sum post-processing, starting from acquisitions of EMI-corrupted signals conditioned by opamp-based amplifiers with similar baseband characteristics but with a different susceptibility to EMI

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Summary

Introduction

Front-End including Off-the-Shelf, The susceptibility to Electromagnetic Interference (EMI) of analog integrated circuits (ICs) [1,2,3] is a major threat to the reliability and to the security of analog signal acquisition front-ends (AFEs) [4,5] in traditional applications such as automotive [6,7,8], biomedical [9]. Publisher’s Note: MDPI stays neutral with regard to jurisdictional claims in published maps and institutional affiliations In this scenario, considering that many challenges and limitations of analog circuits have been recently addressed by digital-based or digitally assisted solutions [17,45,46], rather than by analog design, the possibility to tackle the adverse effects of EMI in opampbased sensor readouts in the digital domain, regardless of the intrinsic susceptibility to EMI of the analog circuits topologies, would be highly desirable.

Acquisition Front-End Immunity by Digital Post-Processing
Proposed Sensor Readout
EMI Distortion in the Conditioning Amplifiers
EMI Compensation by Digital Post-Processing
EMI Suppression Coefficient Calibration
Experimental Validation
EMI Test PCB
Experimental Test Setup
Experimental Results
Tests under CW EMI Excitation
Low Frequency Sinewave Nominal Input and AM EMI Excitation
Conclusions
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