Abstract

We calculate critical electronic conduction parameters of the amorphous phase of Ge2Sb2Te5 (GST), a common material used in phase change memory. We estimate the room temperature bandgap of metastable amorphous GST to be Eg (300K) = 1.84 eV based on a temperature dependent energy band model. We estimate the free carrier concentration at the melting temperature utilizing the latent heat of fusion to be 1.47 x 1022 cm-3. Using the thin film melt resistivity, we calculate the carrier mobility at melting point as 0.187 cm2/V-s. Assuming that metastable amorphous GST is a supercooled liquid with bipolar conduction, we compute the total carrier concentration as a function of temperature and estimate the room temperature free carrier concentration as p(300K) ≈ n(300K) = 1.69×1017 cm-3. Free electrons and holes are expected to recombine over time and the stable (drifted) amorphous GST is estimated to have p-type conduction with p(300K) ≈ 6×1016 cm-3.

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