Abstract
This chapter deals with digital method of calibration for analog integrated circuits as a means of extending its lifetime and reliability, which consequently affects the reliability the analog electronic system as a whole. The proposed method can compensate for drift in circuit’s electrical parameters, which occurs either in a long term due to aging and electrical stress or it is rather more acute, being caused by process, voltage and temperature variations. The chapter reveals the implementation of ultra-low voltage on-chip system of digitally calibrated variable-gain amplifier (VGA), fabricated in CMOS 130 nm technology. It operates reliably under supply voltage of 600mV with 10% variation, in temperature range from −20°C to 85°C. Simulations suggest that the system will preserve its parameters for at least 10 years of operation. Experimental verification over 10 packaged integrated circuit (IC) samples shows the input offset voltage of VGA is suppressed in range of 13μV to 167μV. With calibration the VGA closely meets its nominally designed essential specifications as voltage gain or bandwidth. Digital calibration is comprehensively compared to its widely used alternative, Chopper stabilization through its implementation for the same VGA.
Highlights
Every industry in our world shares the same fundamental motivation - packing as much functionality and power in the smallest possible size
We propose a promising alternative approach based on digital algorithm, that was utilized for the variable gain amplifier
While digital systems are proven to be robust enough to above mentioned fluctuations even below 10 nm process node, their analog counterparts suffer from significantly decreased yield already in 130 nm technology node
Summary
Every industry in our world shares the same fundamental motivation - packing as much functionality and power in the smallest possible size. In development of an integrated circuits fabrication technology, this trend is projecting in scaling down the minimum circuit element dimensions and circuit power supply voltage In this way, higher performance and greater mobility is provided for electronic systems during their use. ICs fabricated in 7 nm or 5 nm Practical Applications in Reliability Engineering process nodes can still perform well in digital signal processing. Their analog counterparts substantially suffer from impaired reliability yet in 130 nm technology. Standard deviation of threshold voltage in matched transistor pair with respect to its size across different process nodes. The Conclusion summarizes the most important outcomes of the presented research
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