Abstract
Single-event hardening solutions for two converter designs with digital control are considered for space radiation environments: 1) a boost converter using static random access memory (SRAM)-based field programmable gate arrays (FPGAs). In this case the hardening approach is based on duplication at both the logic and device levels and on a nondisruptive resynchronization mechanism that ensures the converter operation if single-event functional interrupt occurs. 2) An integrated buck converter that uses redundancy at the register level, as well as modification of the very high speed integrated circuit (VHSIC) hardware description language (VHDL) code. These hardening techniques are validated through experiments and simulations.
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