Abstract
The results of investigations of diffusion processes (condensation-stimulated diffusion (CSD) and thermal diffusion (TD)) in nanoscale Fe/Cu and Fe/Cr Fe/Cutwo-layer film systems by means of Auger electron spectroscopy (AES) are presented. It is established that the effective CSD coefficient is about two orders of magnitude higher than the analogous TD coefficient, which is explained by grain boundary diffusion saturation as early as at the top layer condensation stage.
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