Abstract
A calculation of the surface photovoltage is carried out for semiconductor films with arbitrary deviation from quasiequilibrium in the surface space charge region (SCR), i.e. for any relationship between the diffusion and screening lengths. An anomalous shape of the surface photovoltage spectrum (a decay in the short wavelength range) is explained. A method for correct determination of the carrier diffusion lengths using photovoltage spectra is proposed. Monocrystals of II-V compounds and films of amorphous silicon are used for the experiments. [Russian Text Ignored].
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