Abstract
We demonstrate a novel imaging approach and associated reconstruction algorithm for far-field coherent diffractive imaging, based on the measurement of a pair of laterally sheared diffraction patterns. The differential phase profile retrieved from such a measurement leads to improved reconstruction accuracy, increased robustness against noise, and faster convergence compared to traditional coherent diffractive imaging methods. We measure laterally sheared diffraction patterns using Fourier-transform spectroscopy with two phase-locked pulse pairs from a high-harmonic source. Using this approach, we demonstrate spectrally resolved imaging at extreme ultraviolet wavelengths between 28 and 35 nm.
Highlights
In recent years, coherent diffractive imaging (CDI) has enabled vast progress in high-resolution microscopy [1, 2, 3, 4, 5]
As the image resolution in CDI is not limited by focusing optics, it is well suited for microscopy using x-rays [8], extreme ultraviolet (EUV) radiation [4, 5] or electrons [9]
The apertures act as references for Fourier-transform holography (FTH) by providing a spherical wave which interferes with the diffraction pattern arising from the logo [16]
Summary
Coherent diffractive imaging (CDI) has enabled vast progress in high-resolution microscopy [1, 2, 3, 4, 5]. A specific approach that has shown promise in the context of CDI is lateral shearing interferometry (LSI) [19, 20], a technique that is used to reconstruct the wavefront - or phase profile - of a beam by interfering is with a sheared copy of itself This results in an interference pattern that depends on the spatial derivative of the wavefront, which can be retrieved by spatial Fourier filtering. We employ spatially-resolved Fourier-transform spectroscopy with a pair of phase-locked high-harmonic generation sources [23] From these results we find that our algorithm is able to accurately reconstruct complex electric fields even in the presence of significant noise
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