Abstract
The selected area diffraction information in a single HREM image (Fig. 1) of iron carbide, plasma-deposited onto a carbon support film at 300°C is examined. By “selected area diffraction information” we mean power spectra of selectively digitized regions of the negative. The amount of post microscope diffraction analysis that can be done from a single HREM negative is thus illustrated. It is important for us to know whether these crystals belong to a single phase or whether mixtures of phases are present in these films. X-ray characterization of films deposited on glass substrates at the above deposition temperature have always indicated only Fe7C3. Auger depth profiling data from such films on glass and on carbon support films, along with electron diffraction data from these specimens have indicated the presence of some Fe3O4 in these films as well.Six areas of the negative that showed cross-fringes were digitized and are shown in Fig. 2.
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