Abstract
The complex dielectric constant of Rb0.75(ND4)0.25D2AsO4 along the tetragonal crystallographic c axis has been measured as a function of temperature for frequencies between 100 Hz and 1 MHz. The dielectric relaxation is described using a Frohlich-type distribution function. The expressions for epsilon ' and epsilon " are evaluated on this basis and fitted to the experimental data. The characteristic central frequency fepsilon obeys an Arrhenius law and the relaxation process is polydispersive. Below the freezing temperature Tf=68.9 K the dielectric intensity epsilon (0)- epsilon ( infinity ) is decreasing with decreasing temperature and its temperature dependence can be described by the replica-symmetry-breaking solution of the infinite range Ising spin glass model in the presence of random fields.
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