Abstract
Cd 1−x Zn x S polycrystalline layers were prepared by means of the thermal evaporation of suitable CdZnS solid solutions ( 0⪕x⪕0.2) on different substrates. The ZnS concentration dependence on the crystallinity and the dielectric function has been determined by X-ray patterns, scanning microscopy observation and optical spectrometry in the wavelength range 0.4–250 μm. Castaing microprobe analysis has shown a transverse gradient of zinc concentration. X-ray and optical characterization shows that when x increases, the misorientation of the c-axis increases and the crystallite size decreases and that the band gap and the surface potential increase. The optical phonon spectra has the same one-mode behaviour as in the mixed crystal. The carrier density variation with x depends strongly on the purity of the evaporated powders.
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