Abstract
Single tetragonal La1.5Sr0.5CoO4 ceramics with the space group of I 4/mmm (139) were prepared by a solid-state reaction process, and dielectric characteristics were investigated on a broad frequency and temperature range. There was one obvious dielectric relaxation around room temperature plus a low temperature upturn on the curve of temperature dependence of dielectric properties for La1.5Sr0.5CoO4 ceramics. This dielectric relaxation was a thermal-activated process. It should be attributed to the mixed-valence structure (Co2+/Co3+) since its activation energy was similar to that of small polaronic hopping process. After annealing the sample in O2 atmosphere, dielectric constants and ac conductivities of La1.5Sr0.5CoO4 ceramics increased and decreased after annealing the sample in N2 atmosphere. This abnormal phenomenon should be attributed to the variation of concentration for holes (Co3+).
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