Abstract
An incident x-ray flux monitor for coherent x-ray diffraction microscopy was developed. The intensities of x-rays passing through the sample were measured using an x-ray photodiode, with the simultaneous measurement of the x-ray diffraction intensities of the sample. As a result of the normalization of the x-ray diffraction intensities by the incident x-ray flux determined from the monitor, the fluctuation of the speckle intensities was successfully suppressed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
