Abstract
A new application of the X-ray technique developed by B.E. Warren [1], is presented here. The method, based on statistical fluctuation of counts recorded by a properly modified X-ray diffractometer, has been used to estimate the average grain diameter of different textural classes in metallic polycrystalline materials; it has been tested to evaluate its reproducibility and precision limits. The method appears to be promising for current applications in industrial research laboratories and for quality control routines since specimen preparation is easy and measurement is automated.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
