Abstract
We analyze a new method for determining the out-of-plane coefficient of thermal expansion for thin films of transparent materials. The method is based on the measurement of interference peaks recorded in transmission spectra as a function of sample temperature. The locations of interference peaks depend on the optical path. We show how a consideration of Lorentz-Lorenz equation, in addition to the transmission peak equation, can separate the different contributions of index and physical pathlength to the optical path. The analysis is generalized to include the effects of uniaxial material properties (such as anisotropic linear thermal expansion and birefringence). By applying this method of analysis to recent data, we demonstrate the importance of including the effect of the thermo-optic coefficient in interpreting observed data.
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