Abstract
Low-loss planar transmission lines are required for integrated optical or plasmonic nanocircuits. Full characterization of these lines is necessary for designing nanocircuits. This paper shows a method to calculate the attenuation and propagation constants of a patch-antenna-coupled microstrip transmission line (MTL) at 28.3THz that is suitable for measurement implementation via near-field microscopy techniques. After illumination with a Gaussian beam, a standing wave is formed by the electric near field along the MTL observed at the metal-air interface. By fitting an analytical standing wave expression to the near-field standing wave, the attenuation and propagation constants are determined. With the MTL characterized, a similar technique can be applied to determine the input impedance of an unknown load fed by the MTL. The quantification of antenna impedance and transmission line parameters provide requisite information for improving impedance matching and collection efficiency. Ansys High Frequency Structure Simulator (HFSS) is implemented to predict the computational results.
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