Abstract
The thermophysical properties of thin film materials used for photovoltaic applications are investigated. The measurement procedure that we apply is described in detail. The method is based on a contact-free thermal analysis of free standing thin films using a lock-in thermography system. A laser heat source induces a thermal wave that propagates within the sample. An infrared camera images the wave. From the resulting temperature amplitude and phase images of the wave, the in-plane thermal diffusivity, thermal conductivity, and volumetric heat capacity are deduced. The investigated samples are compound and laminating foils employed in photovoltaic (PV) module encapsulation, as well as a plastic substrate used for thin film solar cell production. The measurement results show large differences in the thermal conductivity of different types of compound materials.
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