Abstract
A two-step procedure is described for measuring the complex refractive index of an anodically produced oxide film on a gold electrode. Both the composition and the thickness of the oxide were determined independently using X-ray photoelectron spectroscopy. These measurements served to define the system and thereby avoid assumptions regarding the film stoichiometry that would otherwise be required. The thickness was then used to calculate values of n and k from ellipsometric data collected across the visible spectrum (350–800 nm).
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