Abstract

Cobalt oxides with multiple local Co-O coordination environments such as octahedral, tetrahedral, and tetragonal networks display versatile electronic and magnetic properties which have attracted great interest in many fields. Understanding the ground-state properties and determining the fundamental band gap remain challenges in cobalt-based compounds and thin films, which have been investigated here using synchrotron-based Co ${L}_{23}$-edge x-ray absorption measurements followed by configuration interaction cluster calculations. We focus on the detailed Co ${L}_{23}$-edge absorption spectral variations in different octahedral crystal fields as well as in the less investigated tetrahedral and tetragonal systems, taking into account Co ions with different valence states. From a quantitative comparison between the simulated spectrum and an accurately measured absorption spectrum of a specified compound, the crystal field value can be extracted from the Co ${L}_{23}$-edge absorption spectrum, which is complementary to the results obtained in optical measurements and other calculations. Furthermore, Co ${L}_{23}$-edge x-ray linear dichroism shows the same spectral evolutions as a result of either local ${\mathrm{CoO}}_{6}$ cluster with tetragonal symmetry or the magnetic exchange field, whereas both coexist in most antiferromagnetic cobalt oxide thin films. Detailed temperature and polarization-dependent Co ${L}_{23}$-edge absorption measurements have been proposed to distinguish both contributions, which show different spectral variations due to the specified modifications of the ground and final states at different temperatures. Our results offer theoretical guidance for understanding the multiplet structure of Co ${L}_{23}$-edge absorption spectrum, obtaining the precise crystal field value for cobalt oxides with versatile coordinations, and explaining the underlying mechanism of x-ray linear dichroism, as well as understanding the fundamental physical properties and their potential applicability of cobalt oxides and their thin films.

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