Abstract
Tritons accelerated up to 3.5 MeV by a Van de Graaff, were used to study the16O(T, n)18F reaction, which was then applied to the analysis of oxygen in metals and semiconductors. The calculated sensitivity for the determination of oxygen is 0.5 ppb at 3.5 MeV. Si, Ti and Mo were analyzed non-destructively at 3.5 MeV and the results agreed with results obtained by other methods. Pure Ge and AsGa were analyzed non-destructively at 3 MeV and the detection limits were respectively 25 and 6 ppb.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
