Abstract
Conditions for the inductively coupled plasma mass-spectrometric (ICP MS) analysis of high-purity tantalum pentoxide and tantalum pentoxide doped with rare-earth elements without the separation of a sample matrix from analytes (Mg, Al, Si, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zr, Nb, Mo, Sn, W, Gd, Dy, Er, and Pb) were determined. The metrological parameters of ICP MS analysis (accuracy, precision, and detection limits) were calculated. It was established that, in the analysis of test sample solutions with tantalum concentrations higher than 30 mg/L, a matrix effect appeared: the intensity of the measured ion current of analytes decreased against the background of a high concentration of sample matrix (tantalum) ions. This caused a proportional underestimation of the results of analysis. It was shown that it is reasonable to plot calibration functions against the background of a solution containing no more than 30 mg/L of tantalum ions. The results of the ICP MS analysis were compared with X-ray fluorescence (XRF) and optical emission spectrometry (OES) analysis data and calculation data on the amounts of admixtures introduced into tantalum pentoxide at the stage of the extraction preparation of a precursor.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
