Abstract

The possibility of group concentration for subsequent arc atomic emission analysis (AAEA) with a multichannel emission spectra analyzer (MESA) aimed at determining trace amounts of platinum metals (PMs) and gold in secondary and technogenic materials using commercial or newly synthesized (via the thiomethylation reaction) sorbents containing nitrogen and sulfur was studied. The conditions for sorption concentration of PMs and gold were determined. The sample preparation method and the conditions for performing the MESA-assisted AAEA of the sorption concentrate were chosen. The impurity detection limits were determined. The possibility of determining the elements at the 10−4–10−5 wt % level was demonstrated. The validity of the results was checked by varying the sample weight and by conducting a comparative experiment with the use of different methods. The other two methods used in this experiment were atomic absorption spectrometry and inductively coupled plasma atomic emission spectrometry.

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