Abstract
In this work we use the previously referred to interference effect [1] which takes place in electroluminescence of thin anodic oxide films, in order to determine film thickness, refraction index of anodic alumina and optical constants of aluminium. In contrast to ref. [1], in this work an interference of Lummer-Gehrke type has been used which offers new application possibilities. The results are in very good agreement with the data obtained by other methods.
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