Detection of explosive materials in dual-energy X-Ray security systems

Abstract

Due to the increasing security needs, X-ray devices have started to be used more and more in security systems. Dual-energy X-ray devices are preferred to conventional ones since they enable Effective Atomic Number (Zeff) estimation that cannot be provided by traditional devices, which use density-based segmentation. In this paper, pure material samples are used to obtain system characteristics. Linear mass attenuation coefficients (μ) of the materials can be calculated by using two leveled images, and these coefficients provide information about the Zeff of substances. After that, they can be classified as organic and inorganic via the effective atomic number method and explicitly identified. As well as this, organic explosives can be detected thanks to this simple and effective approach.