Design and characterisation of a dual probe with double‐loop structure for simultaneous near‐field measurement

Abstract

In this study, a near-field dual probe with a double-loop structure is designed and characterised. The high-performance, low-loss Rogers material and four-layer printed circuit board are applied to design the double detection loop structure, which increases the detection area and effectively improves the frequency response of the probe. The key parameters of the probe, including the frequency response, calibration factor, sensitivity, spatial resolution, isolation and differential electric field suppression are characterised by a microstrip line. Compared with other dual probes, the proposed probe has better frequency response and higher sensitivity. The magnetic field sensitivity is −90.88 dB A/m/ H z $\sqrt{\mathrm{H}\mathrm{z}}$ and the electric field sensitivity is −46.89 dB A/m/ H z $\sqrt{\mathrm{H}\mathrm{z}}$ at 1 GHz.