Design and analysis of central gate organic thin film transistor

Abstract

Abstract This paper presents a novel central gate organic thin-film transistor (OTFT) with electrodes in top-bottom configuration and its comparative performance analysis with conventional single and dual gate OTFTs. The central gate OTFT is comprised of a single gate electrode configured to be the center thin film. A pair of identical dielectric layers viz. top dielectric layer and a bottom dielectric layer on both sides of gate electrode to facilitate the further deposition top and bottom organic semiconductor layer over them respectively. The organic semiconductor layers (OSC) are configured as top OSC layer and a bottom OSC to accommodate two independent conduction channels. The source and drain electrodes are also deposited in pairs in top and bottom configurations. Due to the subtle modifications in the architecture the resultant output drain current of the central gate (CG) OTFT has increased manifold. It has been found in the study that the CG OTFT produces 94%, 76.36%, 80.58% higher drain current than bottom gate bottom contact (BGBC), top gate bottom contact (TGBC) and bottom gate top contact (BGTC) OTFT respectively of similar size, operating under identical voltage regime. Similarly in the case of dual gate (DG) OTFT an improvement of 5.10% has been recorded without any additional gate electrode at the same operating voltages.