Abstract
The dependence of the registration sensitivity of Lexan polycarbonate with depth inside the detector was studied. Samples of Lexan from General Electric were irradiated to two long range ions. These were Ni and Au ions with a projectile energy of 0.3 and 1 GeV/n. Two independent techniques, the track-diameter technique (TDT) and the track profile technique (TPT), were used. The registration sensitivity was measured at depths of 7, 10, 15, 18, 20, 28, 35 and 40 μm inside the detector. The results of the two techniques show that the detector sensitivity decreases gradually with the depth inside the detector. It reaches 20% less compared to sensitivity at the surface after 40 μm have been removed.
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