Abstract
We have performed depth profile analyses of the lattice parameters in epitaxial thin films of La0.67Ca0.33MnO3 to understand the evolution of strain relaxation processes in these materials. The analyses were done using grazing incidence x-ray scattering on films of different thicknesses on (100)-oriented LaAlO3 with a lattice mismatch of −2%. We find that such films exhibit two and sometimes up to three in-plane strained lattice constants, corresponding to a slight orthorhombic distortion of the crystal, as well as near-surface lattice relaxation. As a function of film thickness, we find that the strain is in the same order of magnitude up to a thickness of 70–80nm, after which the strain begins to relax towards the bulk value of the lattice parameters. In addition, we find a depth behavior in the strain which is consistent with the formation of nonuniformly strained islands in the sample.
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