Abstract

We have carried out density and small-angle x-ray scattering measurements on a typical liquid chalcogen (Te, Se) system to investigate its continuous liquid-liquid phase transition. With increasing temperature, the zero-wave-number structure factor $S(0)$ shows a maximum in the middle of the transition region where the density exhibits negative thermal expansion. This is direct evidence of density fluctuations induced by the liquid-liquid phase transition. When the sample is pressurized to 100 MPa, the density and $S(0)$ curves shift to the lower temperature side, which is consistent with the shift of the structural transition. We discuss the similarity between liquid Te and liquid water from the viewpoint of fluctuations induced by the liquid-liquid transition.

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