Abstract
Densities of porous anodic aluminum oxide coatings have been measured to range from 1.1 to 2.2 g/cm3, values approximately 0.3–0.6 times those of bulk . These measurements are obtained by using two independent techniques for determining film parameters, Rutherford backscatter (RBS) of MeV protons and alpha particles and optical or scanning Auger microscopy. The former gives areal densities in units of g/cm2 and the latter two thicknesses in units of cm. Additional information on the composition of the films studied using ion‐induced x‐ray analysis simultaneously with RBS is: (i) the compositions are mainly with small amounts of or for those anodic layers grown in or electrolytes, respectively; (ii) sulfur is present as a contaminant in layers grown in electrolytes; (iii) there is a reduction in the concentration of the alloying elements in anodized films grown on 7075 T‐73 Al; (iv) atoms from the cathode are deposited on the film surfaces during anodization; (v) chlorine is present throughout the surface of alumina samples severely corroded in solutions.
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